24.03.2017

At the Analytica Expo 2017 exhibition, the X-ray diffractometer Difray-401M was presented for the first time

The first instrument of this type was released in 2013. Now, several instruments are being successfully operated at industrial enterprises and scientific research institutes.

The instrument is used to carry out the following tasks:

• Control of single crystals surface orientation

• Determination of film thickness on crystals

• Base plane search

• Analysis of powder samples

• Study of plates, membranes, textures and coatings

The experience of using the X-ray diffractometer Difray-401M has shown that its performance characteristics are not inferior to those of competing instruments. This has been achieved at a significantly lower instrument price and operating costs.

‎

‎

‎3D view of the diffraction maximum (110) of the sapphire sample. The misorientation angle is 8 degrees